Abstract:
A test generation system, developed for the logic boards of the Illiac IV computer, is described. The system combines the test generation by random patterns and the D-alg...Show MoreMetadata
Abstract:
A test generation system, developed for the logic boards of the Illiac IV computer, is described. The system combines the test generation by random patterns and the D-algorithm. Some results are given to illustrate the effectiveness of this approach.
Published in: IEEE Transactions on Computers ( Volume: C-21, Issue: 9, September 1972)