An Automatic Test Generation System for Illiac IV Logic Boards | IEEE Journals & Magazine | IEEE Xplore

An Automatic Test Generation System for Illiac IV Logic Boards


Abstract:

A test generation system, developed for the logic boards of the Illiac IV computer, is described. The system combines the test generation by random patterns and the D-alg...Show More

Abstract:

A test generation system, developed for the logic boards of the Illiac IV computer, is described. The system combines the test generation by random patterns and the D-algorithm. Some results are given to illustrate the effectiveness of this approach.
Published in: IEEE Transactions on Computers ( Volume: C-21, Issue: 9, September 1972)
Page(s): 1015 - 1017
Date of Publication: 29 May 2009

ISSN Information:


References

References is not available for this document.