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On Dependence and Discrimination in Pattern Recognition | IEEE Journals & Magazine | IEEE Xplore

On Dependence and Discrimination in Pattern Recognition


Abstract:

A new measure of dependence is formulated, and some of its properties are described. The measure is applied to feature evaluation to show the relation of dependence betwe...Show More

Abstract:

A new measure of dependence is formulated, and some of its properties are described. The measure is applied to feature evaluation to show the relation of dependence between features and classes to discrimination between class-conditional probability distributions.
Published in: IEEE Transactions on Computers ( Volume: C-21, Issue: 9, September 1972)
Page(s): 1029 - 1031
Date of Publication: 30 September 1972

ISSN Information:


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