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An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories | IEEE Journals & Magazine | IEEE Xplore

An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories


Abstract:

This correspondence presents an optimal algorithm to detect any single "stuck-at-i," "stuck-at-O" fault and any combination of "stuck-at-I," "stuck-at-O" multiple faults ...Show More

Abstract:

This correspondence presents an optimal algorithm to detect any single "stuck-at-i," "stuck-at-O" fault and any combination of "stuck-at-I," "stuck-at-O" multiple faults in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2n memory accesses.
Published in: IEEE Transactions on Computers ( Volume: C-26, Issue: 11, November 1977)
Page(s): 1141 - 1144
Date of Publication: 30 November 1977

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