Abstract:
A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented.Metadata
Abstract:
A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented.
Published in: IEEE Transactions on Computers ( Volume: C-29, Issue: 6, June 1980)
