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Random Pattern Testability


Abstract:

A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using ful...Show More

Abstract:

A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using full-fault simulation does not seem attractive because of the logic structure volume, and the CPU time encountered. A new approach is therefore necessary. This paper describes a new analytical method of computing the fault coverage that is fast compared with simulation. If the fault coverage falls below a certain threshold, it is possible to identify the ``random-pattern-resistant'' faults, modify the logic to make them easy to detect, and thus, increase the fault coverage of the random test.
Published in: IEEE Transactions on Computers ( Volume: C-33, Issue: 1, January 1984)
Page(s): 79 - 90
Date of Publication: 29 May 2009

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