Abstract:
Most NP-completeness results for test generation problems involve a reduction to the redundancy problem, which explicitly encodes the satisfiability problem. In this corr...Show MoreMetadata
Abstract:
Most NP-completeness results for test generation problems involve a reduction to the redundancy problem, which explicitly encodes the satisfiability problem. In this correspondence we investigate the complexity of a more modest problem-that of estimating the size of a test set under the constraint that the circuit is irredundant. We show that even this constrained problem is NP-hard in the strong sense.
Published in: IEEE Transactions on Computers ( Volume: C-33, Issue: 8, August 1984)