Checkpoint Faults are not Sufficient Target Faults for Test Generation | IEEE Journals & Magazine | IEEE Xplore

Checkpoint Faults are not Sufficient Target Faults for Test Generation


Abstract:

Stuck-at faults on primary inputs and fan-out branches are commonly used as target faults in test generation algorithms for combinational circuits. This correspondence sh...Show More

Abstract:

Stuck-at faults on primary inputs and fan-out branches are commonly used as target faults in test generation algorithms for combinational circuits. This correspondence shows that these faults may not constitute an adequate set of target faults. A procedure is presented for selecting a set of target faults with the property that the detection of all detectable faults from this set guarantees the detection of all detectable faults in the circuit.
Published in: IEEE Transactions on Computers ( Volume: C-35, Issue: 8, August 1986)
Page(s): 769 - 771
Date of Publication: 31 August 1986

ISSN Information:


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