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Monte Carlo Simulation of the Photoelectron Crosstalk in Silicon Imaging Devices | IEEE Journals & Magazine | IEEE Xplore

Monte Carlo Simulation of the Photoelectron Crosstalk in Silicon Imaging Devices


Abstract:

The Monte Carlo method is used to evaluate the extent of the crosstalk in solid-state imagers. The calculations are performed in three dimensions and are in excellent agr...Show More

Abstract:

The Monte Carlo method is used to evaluate the extent of the crosstalk in solid-state imagers. The calculations are performed in three dimensions and are in excellent agreement with experiment. The Monte Carlo method is used because it handles adjacent regions that either collect or reflect minority carriers.
Page(s): 531 - 535
Date of Publication: 31 October 1985

ISSN Information:


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