BIST-Based Fault Diagnosis for Read-Only Memories | IEEE Journals & Magazine | IEEE Xplore

BIST-Based Fault Diagnosis for Read-Only Memories


Abstract:

This paper presents a built-in self-test (BIST)-based scheme for fault diagnosis that can be used to identify permanent failures in embedded read-only memories. The propo...Show More

Abstract:

This paper presents a built-in self-test (BIST)-based scheme for fault diagnosis that can be used to identify permanent failures in embedded read-only memories. The proposed approach offers a simple test flow and does not require intensive interactions between a BIST controller and a tester. The scheme rests on partitioning of rows and columns of the memory array by employing low cost test logic. It is designed to meet requirements of at-speed test thus enabling detection of timing defects. Experimental results confirm high diagnostic accuracy of the proposed scheme and its time efficiency.
Page(s): 1072 - 1085
Date of Publication: 13 June 2011

ISSN Information:


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