Erratum to “Time-Multiplexed-Network for Test Cost Reduction” [Aug 18 1681-1691]

Abstract:

In [1], the corresponding author was incorrect. The correct corresponding author is Sungju Park.

In [1], the corresponding author was incorrect. The correct corresponding author is Sungju Park.

Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ( Volume: 37, Issue: 9, September 2018)

Page(s): 1912 - 1912

Date of Publication: 19 August 2018

DOI: 10.1109/TCAD.2018.2861341

References is not available for this document.