Loading [MathJax]/extensions/MathMenu.js
On Error Injection for NoC Platforms: A UVM-Based Generic Verification Environment | IEEE Journals & Magazine | IEEE Xplore

On Error Injection for NoC Platforms: A UVM-Based Generic Verification Environment


Abstract:

Error injection has become critically important for testing the reliability of newly designed hardware systems. Evaluating how a design under test (DUT) reacts to differe...Show More

Abstract:

Error injection has become critically important for testing the reliability of newly designed hardware systems. Evaluating how a design under test (DUT) reacts to different error-injection methodologies is essential for verification engineers to design dependable universal verification methodology (UVM) scoreboards for error-detection purposes. The first main contribution of this paper is to decide on the feasibility and compatibility of some error-injection techniques when used with networks-on-chip (NoC) platforms for simulation and hardware emulation environments. We target a UVM-based error-injection and detection environment with reusable components. Proposed techniques, introducing both positive and negative test scenarios, are applied to two examples of NoC components: 1) a base router and 2) Daniel router. Base router is a simple case study to prove proposed schemes, whereas Daniel router is a complex reconfigurable open-source case study. Daniel router provides the ability to change router architecture with some parameters and applied algorithms. The second main contribution of this paper is to integrate a full UVM environment with various verification approaches. Target approaches include error injection and detection using reusable and generic UVM environment and components for NoC. Network response is inspected according to error type and methodology. Finally, the proposed UVM environment is used to test and verify an N × N 2-D network composed of base routers or Daniel routers.
Page(s): 1137 - 1150
Date of Publication: 02 April 2019

ISSN Information:


Contact IEEE to Subscribe

References

References is not available for this document.