Loading [a11y]/accessibility-menu.js
LBIST for Automotive ICs With Enhanced Test Generation | IEEE Journals & Magazine | IEEE Xplore

Abstract:

Contemporary and emergent automotive systems are heavily populated by complex integrated electronics. The number of safety-critical devices used in advanced driver-assist...Show More

Abstract:

Contemporary and emergent automotive systems are heavily populated by complex integrated electronics. The number of safety-critical devices used in advanced driver-assistance systems or autonomous vehicles is growing with high-end models containing hundreds of embedded microcontrollers. Achieving functionally safe automotive electronics requires test solutions that might be costly to engineer. Therefore, to address challenges posed by high-quality and long-term reliability requirements, this article presents low-cost test pattern generation schemes for a scan-based hybrid logic BIST of automotive ICs. It may allow one to optimize test coverage and test time during in-system test applications. The first presented technique deploys a seed-flipping PRPG to periodically complement PRPG stages in a methodical tree-traversal manner. The second scheme is based on a seed-sorting approach that allows additional tradeoffs between test data volume and test coverage. As shown in this article, the proposed schemes can be easily integrated with a test compression environment and deployed in different modes of in-system testing, such as key-off, key-on, and periodic (incremental) online tests. Experimental results obtained for automotive designs and reported herein show improvements in test quality over conventional logic BIST schemes.
Page(s): 2290 - 2300
Date of Publication: 28 July 2021

ISSN Information:

Funding Agency:


References

References is not available for this document.