Trace-by-classification: A machine learning approach to generate trace links for frequently occurring software artifacts | IEEE Conference Publication | IEEE Xplore

Trace-by-classification: A machine learning approach to generate trace links for frequently occurring software artifacts


Abstract:

Over the past decade the traceability research community has focused upon developing and improving trace retrieval techniques in order to retrieve trace links between a s...Show More

Abstract:

Over the past decade the traceability research community has focused upon developing and improving trace retrieval techniques in order to retrieve trace links between a source artifact, such as a requirement, and set of target artifacts, such as a set of java classes. In this Trace Challenge paper we present a previously published technique that uses machine learning to trace software artifacts that recur is similar forms across across multiple projects. Examples include quality concerns related to non-functional requirements such as security, performance, and usability; regulatory codes that are applied across multiple systems; and architectural-decisions that are found in many different solutions. The purpose of this paper is to release a publicly available TraceLab experiment including reusable and modifiable components as well as associated datasets, and to establish baseline results that would encourage further experimentation.
Date of Conference: 19-19 May 2013
Date Added to IEEE Xplore: 07 October 2013
Electronic ISBN:978-1-4799-0495-2

ISSN Information:

Conference Location: San Francisco, CA, USA

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