Abstract:
Summary form only given. The test time of the memory chip is a very important issue. It mainly depends on the program and erase time. NAND flash memories perform high spe...Show MoreMetadata
Abstract:
Summary form only given. The test time of the memory chip is a very important issue. It mainly depends on the program and erase time. NAND flash memories perform high speed programming and erasing. This high speed reprogramming scheme reduces the test cost. The program/erase endurance reliability is another important test issue. In order to perform at high reliability, NAND flash memories use ECC technology. Using ECC technology, multi-level as well as single-level NAND flash memories perform with high endurance reliabilities.
Published in: Proceedings. International Test Conference
Date of Conference: 10-10 October 2002
Date Added to IEEE Xplore: 10 December 2002
Print ISBN:0-7803-7542-4
Print ISSN: 1089-3539
Contents 