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Ultra low cost linear testing
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M.A. Jones
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First Page of the Article
Published in:
International Test Conference, 2003. Proceedings. ITC 2003.
Date of Conference:
30 September 2003 - 02 October 2003
Date Added to IEEE
Xplore
:
08 March 2004
Print ISBN:
0-7803-8106-8
Print ISSN:
1089-3539
DOI:
10.1109/TEST.2003.1270878
Publisher:
IEEE
Conference Location:
Charlotte, NC, USA
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