Cost-effective approach for reducing soft error failure rate in logic circuits | IEEE Conference Publication | IEEE Xplore

Cost-effective approach for reducing soft error failure rate in logic circuits


First Page of the Article

Date of Conference: 30 September 2003 - 02 October 2003
Date Added to IEEE Xplore: 08 March 2004
Print ISBN:0-7803-8106-8
Print ISSN: 1089-3539
Conference Location: Charlotte, NC, USA

First Page of the Article


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