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Non-deterministic DUT behavior during functional testing of high speed serial busses: challenges and solutions | IEEE Conference Publication | IEEE Xplore

Non-deterministic DUT behavior during functional testing of high speed serial busses: challenges and solutions


Abstract:

The characteristics defining non-determinism for PCI Express busses are explored. The RapidIO/sup /spl reg// bus is used as a point of comparison. ATE architecture is pro...Show More

Abstract:

The characteristics defining non-determinism for PCI Express busses are explored. The RapidIO/sup /spl reg// bus is used as a point of comparison. ATE architecture is proposed to significantly reduce the yield and throughput impact of random output. A specific architecture is explored and proposed for real-time pass/fail analysis of HSS data streams in the ATE environment.
Date of Conference: 26-28 October 2004
Date Added to IEEE Xplore: 31 January 2005
Print ISBN:0-7803-8580-2
Conference Location: Charlotte, NC, USA

References

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