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Safely backdriving low voltage devices at in-circuit test | IEEE Conference Publication | IEEE Xplore

Safely backdriving low voltage devices at in-circuit test


Abstract:

Effective in-circuit digital testing sometimes forces upstream devices to an opposite logic level with large currents during the test. Safely "backdriving" has been a cha...Show More

Abstract:

Effective in-circuit digital testing sometimes forces upstream devices to an opposite logic level with large currents during the test. Safely "backdriving" has been a challenge for in-circuit digital testing since its introduction two decades ago. A widely used approach has been to limit the duration of the backdrive current based on physical device parameters and failure mechanisms. This predictive method has recently been updated based on new research using modern low voltage (LV) logic families
Date of Conference: 08-08 November 2005
Date Added to IEEE Xplore: 06 February 2006
Print ISBN:0-7803-9038-5

ISSN Information:

Conference Location: Austin, TX

References

References is not available for this document.