Abstract:
A scan circuit construction obviates ATPG constraints for the prevention of tristate contention on internal tristate busses and one-hot muxes. The circuit is supported by...Show MoreMetadata
Abstract:
A scan circuit construction obviates ATPG constraints for the prevention of tristate contention on internal tristate busses and one-hot muxes. The circuit is supported by enhanced ATPG.
Published in: IEEE International Conference on Test, 2005.
Date of Conference: 08-08 November 2005
Date Added to IEEE Xplore: 06 February 2006
Print ISBN:0-7803-9038-5
Contents 