Abstract:
An extended fault model and novel strategy to tackle interconnect faults in network-on-chips are proposed. Short faults between distinct channels are considered in a cost...Show MoreMetadata
Abstract:
An extended fault model and novel strategy to tackle interconnect faults in network-on-chips are proposed. Short faults between distinct channels are considered in a cost-effective test sequence for Mesh NoC topologies based on XY routing.
Published in: 2007 IEEE International Test Conference
Date of Conference: 21-26 October 2007
Date Added to IEEE Xplore: 22 January 2008
ISBN Information:
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