Loading [a11y]/accessibility-menu.js
Using built-in sensors to cope with long duration transient faults in future technologies | IEEE Conference Publication | IEEE Xplore
Subscribe
ADVANCED SEARCH
Conferences >2007 IEEE International Test ...

Using built-in sensors to cope with long duration transient faults in future technologies

PDF
C. A. Lisboa; F. L. Kastensmidt; E. Henes Neto; G. Wirth; L. Carro
All Authors

Abstract:

Transients spanning more than one clock cycle will challenge soft error tolerant designs for future technologies. To face this problem, a low overhead technique that uses...Show More

Metadata

Abstract:

Transients spanning more than one clock cycle will challenge soft error tolerant designs for future technologies. To face this problem, a low overhead technique that uses bulk built-in current sensors and recomputation is proposed here.
Published in: 2007 IEEE International Test Conference
Date of Conference: 21-26 October 2007
Date Added to IEEE Xplore: 22 January 2008
ISBN Information:

ISSN Information:

DOI: 10.1109/TEST.2007.4437631
Conference Location: Santa Clara, CA, USA
Contents
Contact IEEE to Subscribe

References

References is not available for this document.

IEEE Account

Purchase Details

Profile Information

Need Help?

A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.