High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST | IEEE Conference Publication | IEEE Xplore

High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST


Abstract:

The paper presents a BIST-based fault diagnosis scheme that can be used to identify a variety of failures in embedded memory arrays. The proposed solution employs flexibl...Show More

Abstract:

The paper presents a BIST-based fault diagnosis scheme that can be used to identify a variety of failures in embedded memory arrays. The proposed solution employs flexible test logic to record test responses at the system speed with no interruptions of a BIST session. It offers a simple test flow and enables detection of time-related faults. Furthermore, the way the test responses are processed allows accurate reconstruction of error bitmaps.
Date of Conference: 28-30 October 2008
Date Added to IEEE Xplore: 08 December 2008
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Conference Location: Santa Clara, CA, USA

References

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