A Generic Framework for Scan Capture Power Reduction in Test Compression Environment | IEEE Conference Publication | IEEE Xplore

A Generic Framework for Scan Capture Power Reduction in Test Compression Environment


Abstract:

This work proposes a generic framework for reducing scan capture power in test compression environment. Using the entropy of the test set to measure the impact of capture...Show More

Abstract:

This work proposes a generic framework for reducing scan capture power in test compression environment. Using the entropy of the test set to measure the impact of capture power-aware X-filling on the potential test compression ratio, the proposed method is able to keep capture power under a safe limit with little loss in test compression ratio.
Date of Conference: 28-30 October 2008
Date Added to IEEE Xplore: 08 December 2008
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Conference Location: Santa Clara, CA, USA

References

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