Abstract:
This work proposes a generic framework for reducing scan capture power in test compression environment. Using the entropy of the test set to measure the impact of capture...Show MoreMetadata
Abstract:
This work proposes a generic framework for reducing scan capture power in test compression environment. Using the entropy of the test set to measure the impact of capture power-aware X-filling on the potential test compression ratio, the proposed method is able to keep capture power under a safe limit with little loss in test compression ratio.
Published in: 2008 IEEE International Test Conference
Date of Conference: 28-30 October 2008
Date Added to IEEE Xplore: 08 December 2008
ISBN Information: