Fault diagnosis for embedded read-only memories | IEEE Conference Publication | IEEE Xplore

Fault diagnosis for embedded read-only memories


Abstract:

The paper presents a BIST-based scheme for fault diagnosis that can be used to identify permanent and address independent failures in embedded read-only memories. The pro...Show More

Abstract:

The paper presents a BIST-based scheme for fault diagnosis that can be used to identify permanent and address independent failures in embedded read-only memories. The proposed approach offers a simple test flow and does not require intensive interactions between a BIST controller and a tester. The scheme rests on partitioning of rows and columns of the memory array by employing low cost test logic. It is designed to meet requirements of at-speed test thus enabling detection of time-related faults.
Date of Conference: 01-06 November 2009
Date Added to IEEE Xplore: 18 December 2009
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Conference Location: Austin, TX, USA

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