A2DTest: A complete integrated solution for on-chip ADC self-test and analysis | IEEE Conference Publication | IEEE Xplore

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis


Abstract:

An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering t...Show More

Abstract:

An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.
Date of Conference: 01-06 November 2009
Date Added to IEEE Xplore: 18 December 2009
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Conference Location: Austin, TX, USA

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