Abstract:
An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering t...Show MoreMetadata
Abstract:
An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.
Published in: 2009 International Test Conference
Date of Conference: 01-06 November 2009
Date Added to IEEE Xplore: 18 December 2009
ISBN Information: