Abstract:
This poster describes high speed I/O test cable interfaces for next generation multi-gigabit serial protocols such as PCI-Express incorporating 3M¿ shielded controlled im...Show MoreMetadata
Abstract:
This poster describes high speed I/O test cable interfaces for next generation multi-gigabit serial protocols such as PCI-Express incorporating 3M¿ shielded controlled impedance (SCI) connector systems, spring probe board interfaces and low loss twinaxial cable assemblies with performance capabilities up to 12 Gbps.
Published in: 2009 International Test Conference
Date of Conference: 01-06 November 2009
Date Added to IEEE Xplore: 18 December 2009
ISBN Information: