Abstract:
This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.Metadata
Abstract:
This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
Published in: 2009 International Test Conference
Date of Conference: 01-06 November 2009
Date Added to IEEE Xplore: 18 December 2009
ISBN Information: