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Non-invasive RF built-in testing using on-chip temperature sensors | IEEE Conference Publication | IEEE Xplore

Non-invasive RF built-in testing using on-chip temperature sensors

Publisher: IEEE

Abstract:

This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.

Abstract:

This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
Date of Conference: 01-06 November 2009
Date Added to IEEE Xplore: 18 December 2009
ISBN Information:

ISSN Information:

Publisher: IEEE
Conference Location: Austin, TX, USA

References

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