Abstract:
The paper presents a new power-aware test scheme compatible with a newly proposed test compression environment based on deterministic clustering of test cubes with confli...Show MoreMetadata
Abstract:
The paper presents a new power-aware test scheme compatible with a newly proposed test compression environment based on deterministic clustering of test cubes with conflicts. The key contribution is a flexible test application framework that achieves significant reductions in switching activity during scan loading by means of a tri-modal test data decompressor.
Published in: 2010 IEEE International Test Conference
Date of Conference: 02-04 November 2010
Date Added to IEEE Xplore: 20 January 2011
ISBN Information: