Low power compression of incompatible test cubes | IEEE Conference Publication | IEEE Xplore

Low power compression of incompatible test cubes


Abstract:

The paper presents a new power-aware test scheme compatible with a newly proposed test compression environment based on deterministic clustering of test cubes with confli...Show More

Abstract:

The paper presents a new power-aware test scheme compatible with a newly proposed test compression environment based on deterministic clustering of test cubes with conflicts. The key contribution is a flexible test application framework that achieves significant reductions in switching activity during scan loading by means of a tri-modal test data decompressor.
Date of Conference: 02-04 November 2010
Date Added to IEEE Xplore: 20 January 2011
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Conference Location: Austin, TX, USA

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