EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism | IEEE Conference Publication | IEEE Xplore

EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism


Abstract:

The paper presents a new channel allocation method for higher Embedded Deterministic Test (EDT) compression in SoC designs comprising isolated cores. It employs a test da...Show More

Abstract:

The paper presents a new channel allocation method for higher Embedded Deterministic Test (EDT) compression in SoC designs comprising isolated cores. It employs a test data reduction technique, which allows cores to interface with ATE through an optimized number of channels. This feature is subsequently used by a new test scheduling and test access mechanisms devised for both the input and output sides. Experimental results obtained for large industrial SoC designs illustrate feasibility of the proposed test application scheme and are reported herein.
Date of Conference: 20-22 September 2011
Date Added to IEEE Xplore: 26 January 2012
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Conference Location: Anaheim, CA, USA

References

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