Low power test application with selective compaction in VLSI designs | IEEE Conference Publication | IEEE Xplore

Low power test application with selective compaction in VLSI designs


Abstract:

The paper presents an extended summary of the PhD thesis that tackles a low power decompression of test cubes in EDT environment and compaction of test responses in the p...Show More

Abstract:

The paper presents an extended summary of the PhD thesis that tackles a low power decompression of test cubes in EDT environment and compaction of test responses in the presence of unknown states. The proposed low power decompression schemes allow one to reduce the load and unload switching activity by more than 93% and capture transitions by 52%. The X-masking scheme introduced in the thesis offers up to 48,000 x compression of control data, and eliminates all unknown states from test responses.
Date of Conference: 05-08 November 2012
Date Added to IEEE Xplore: 07 January 2013
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Conference Location: Anaheim, CA, USA

References

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