Abstract:
Acquisition of wide bandwidth signals is a significant problem in manufacturing test due to the cost of test equipment driven by the use of high-speed sample and hold cir...Show MoreMetadata
Abstract:
Acquisition of wide bandwidth signals is a significant problem in manufacturing test due to the cost of test equipment driven by the use of high-speed sample and hold circuitry and difficulty in data-clock synchronization. We propose to combine frequency interleaved down conversion (to overcome the bandwidth limitations of sample and hold circuitry) with incoherent undersampling (to overcome data-clock synchronization and ADC speed issues) to design a low cost instrumentation for high speed signal capture. A novel signal reconstruction algorithm is developed along with a method for calibrating the effects of unknown delays in data acquisition hardware due to mismatch in signal path lengths on the reconstructed signal. Simulation results and preliminary hardware validation prove the feasibility of the proposed technique.
Published in: 2012 IEEE International Test Conference
Date of Conference: 05-08 November 2012
Date Added to IEEE Xplore: 07 January 2013
ISBN Information: