Abstract:
The paper presents a novel test data compression scheme. The invention follows from a fundamental observation that in a typical test cube only a small portion of the spec...Show MoreMetadata
Abstract:
The paper presents a novel test data compression scheme. The invention follows from a fundamental observation that in a typical test cube only a small portion of the specified positions are necessary to detect a fault, and most of the remaining ones have many alternatives. The necessary assignments are used to form test templates which both control a decompressor to guarantee the necessary assignments and guide ATPG to find alternative assignments to produce highly compressible test cubes. The proposed approach synergistically elevates compression ratios to values typically unachievable through conventional reseeding-based solutions. It also reduces, in a user-controlled manner, switching rates in scan chains with minimal hardware modification. Experimental results obtained for large industrial designs illustrate feasibility of the proposed test scheme and are reported herein.
Published in: 2014 International Test Conference
Date of Conference: 20-23 October 2014
Date Added to IEEE Xplore: 09 February 2015
Electronic ISBN:978-1-4799-4722-5