Abstract:
The introduction of FinFET technology has accelerated the adoption of patterns that target cell internal defects such as cell-aware tests. Even though cell-aware tests ca...Show MoreMetadata
Abstract:
The introduction of FinFET technology has accelerated the adoption of patterns that target cell internal defects such as cell-aware tests. Even though cell-aware tests can replace stuck-at and transition patterns from the screening point of view, we have to address the increase in test data volume. This combined with the growing gate counts enabled by new technology nodes is driving the need for even greater compression levels. In this paper, we present a novel test points technology designed to reduce deterministic pattern counts for cell-aware tests. The technology is based on identification and resolution of conflicts across internal signals allowing ATPG to significantly increase the number of faults targeted by a single pattern. Experimental results on a number of industrial designs with test compression demonstrate that the proposed test points are effective in achieving, on average, a 3×–4× multiplicative increase in compression for 1-cycle and 2-cycle cell-aware patterns.
Published in: 2015 IEEE International Test Conference (ITC)
Date of Conference: 06-08 October 2015
Date Added to IEEE Xplore: 03 December 2015
Electronic ISBN:978-1-4673-6578-9