The prevalence of bridging defects makes bridging fault models important to consider during fault simulation and test generation. The large number of bridging faults that can be defined for a circuit led to the development of procedures for selecting subsets of bridging faults that are likely to occur based on the circuit layout, and hard-to-detect bridging faults whose coverage provides a more effective representation for the quality of a test set. This paper develops a procedure for the selection of subsets of bridging faults that addresses the need to provide a uniform coverage of the circuit in order to prevent areas with low coverage from resulting in test escapes. In an iterative process, the procedure described in this paper uses a set of randomly selected bridging faults to compute coverage metrics for circuit lines. The lines with low coverages are used for defining a new set of bridging faults that are targeted for test generation. The iterative process updates this information to ensure that the lines with the lowest coverages continue to be targeted. A single iteration without performing test generation can be used for evaluating a test set or comparing different test sets with respect to their ability to cover the circuit.