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An effective functional safety solution for automotive systems-on-chip | IEEE Conference Publication | IEEE Xplore

An effective functional safety solution for automotive systems-on-chip


Abstract:

A functional safety solution based on multi-purpose built-in self-test and repair infrastructure for automotive SoCs is presented. This solution allows building a hierarc...Show More

Abstract:

A functional safety solution based on multi-purpose built-in self-test and repair infrastructure for automotive SoCs is presented. This solution allows building a hierarchical network and managing it in multiple in-field test and repair modes.
Date of Conference: 31 October 2017 - 02 November 2017
Date Added to IEEE Xplore: 01 January 2018
ISBN Information:
Electronic ISSN: 2378-2250
Conference Location: Fort Worth, TX, USA

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