The Optimized Deep Belief Networks With Improved Logistic Sigmoid Units and Their Application in Fault Diagnosis for Planetary Gearboxes of Wind Turbines | IEEE Journals & Magazine | IEEE Xplore

The Optimized Deep Belief Networks With Improved Logistic Sigmoid Units and Their Application in Fault Diagnosis for Planetary Gearboxes of Wind Turbines


Abstract:

Efficient and accurate planetary gearbox fault diagnosis is the key to enhance the reliability and security of wind turbines. Therefore, an intelligent and integrated app...Show More

Abstract:

Efficient and accurate planetary gearbox fault diagnosis is the key to enhance the reliability and security of wind turbines. Therefore, an intelligent and integrated approach based on deep belief networks (DBNs), improved logistic Sigmoid (Isigmoid) units, and impulsive features is proposed in this paper. The vanishing gradient problem is an inherent drawback of conventional Sigmoid units, and it usually occurs in the backpropagation process of DBNs, resulting in that the training is considerably slowed down and the classification rate is reduced. To solve this problem, Isigmoid units are designed to combine the merits of unsaturation from leaky rectified linear (LReL) units. The results of handwritten digit recognition experiments show the superiority of Isigmoid over Sigmoid on convergence speed and classification accuracy. Since impulses contain much useful fault information, especially for early failures, an integrated approach using the optimized Morlet wavelet transform, kurtosis index, and soft-thresholding is applied to extract impulse components from original signals to improve the diagnosis accuracy. Then, the features extracted from original signals and impulsive signals are employed to train and test the DBNs with Isigmoid, Sigmoid, and LReL units for comparison. Finally, the results of planetary gearbox fault diagnosis show that Isigmoid has higher comprehensive performance than conventional sigmoid and LReL.
Published in: IEEE Transactions on Industrial Electronics ( Volume: 66, Issue: 5, May 2019)
Page(s): 3814 - 3824
Date of Publication: 19 July 2018

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