Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction | IEEE Journals & Magazine | IEEE Xplore

Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction


Abstract:

Nonferromagnetic metal materials are widely used in industry. Defects generated during manufacture and use may lead to serious accidents. The defect reconstruction is imp...Show More

Abstract:

Nonferromagnetic metal materials are widely used in industry. Defects generated during manufacture and use may lead to serious accidents. The defect reconstruction is important for nondestructive evaluation. Eddy current pulsed thermography (ECPT) is a well-known nondestructive testing and evaluation method, but hardly reconstruct fully defect profile. Electrical impedance tomography (EIT) shows promising potential in defect profile reconstruction, but suffers from electrode number limitation. In this article, EIT is introduced to ECPT image sequences processing, and a new method, induced current thermo-electrical impedance tomography, is developed. The proposed method takes each infrared camera pixel as a virtual electrode, captures the electric current distribution with spatial resolution as high as camera, and reconstructs conductivity distribution at pixel level from which the defect profile can be identified. Experiments with different defects are carried out to verify the performance of the proposed method.
Published in: IEEE Transactions on Industrial Informatics ( Volume: 20, Issue: 2, February 2024)
Page(s): 1862 - 1870
Date of Publication: 02 June 2023

ISSN Information:

Funding Agency:


Contact IEEE to Subscribe

References

References is not available for this document.