Abstract:
The six articles in this special issue were originally presented at the 2009 International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC'0...Show MoreMetadata
Abstract:
The six articles in this special issue were originally presented at the 2009 International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC'09), held at the Oriental Institute of Technology, Taipei, Taiwan, on June 24-26, 2009.
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 59, Issue: 12, December 2010)
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