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Toward a BITE for Real-Time Life Estimation of Capacitors Subjected to Thermal Stress | IEEE Journals & Magazine | IEEE Xplore

Toward a BITE for Real-Time Life Estimation of Capacitors Subjected to Thermal Stress


Abstract:

The use of a built-in test equipment (BITE) that is able to provide a real-time diagnostic of a monitored device allows increasing reliability and decreasing costs. The B...Show More

Abstract:

The use of a built-in test equipment (BITE) that is able to provide a real-time diagnostic of a monitored device allows increasing reliability and decreasing costs. The BITE operation can be based on a suitable life model of the device that must relate the time to failure to the “stress history” of the component. The life model is developed by exploiting the results of a proper measurement campaign. This paper investigates a life model for capacitors subjected to both constant and time-varying temperatures by illustrating the test system and discussing the achieved results.
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 60, Issue: 5, May 2011)
Page(s): 1674 - 1681
Date of Publication: 24 January 2011

ISSN Information:


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