Abstract:
The 42 papers in this special issue are extended versions of papers presented at the 28th annual IEEE International Instrumentation and Measurement Technology Conference,...Show MoreMetadata
Abstract:
The 42 papers in this special issue are extended versions of papers presented at the 28th annual IEEE International Instrumentation and Measurement Technology Conference, held in Hangzhou, China, on 9-12 May 2011.
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 61, Issue: 5, May 2012)