Special Issue on the 2011 IEEE International Instrumentation and Measurement Technology Conference | IEEE Journals & Magazine | IEEE Xplore

Special Issue on the 2011 IEEE International Instrumentation and Measurement Technology Conference


Abstract:

The 42 papers in this special issue are extended versions of papers presented at the 28th annual IEEE International Instrumentation and Measurement Technology Conference,...Show More

Abstract:

The 42 papers in this special issue are extended versions of papers presented at the 28th annual IEEE International Instrumentation and Measurement Technology Conference, held in Hangzhou, China, on 9-12 May 2011.
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 61, Issue: 5, May 2012)
Page(s): 1138 - 1139
Date of Publication: 23 February 2012

ISSN Information: