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New Permittivity Measurement Methods Using Resonant Phenomena For High-Permittivity Materials | IEEE Journals & Magazine | IEEE Xplore

New Permittivity Measurement Methods Using Resonant Phenomena For High-Permittivity Materials


Abstract:

This paper describes the characterization of high-permittivity materials with a dielectric constant (∈r) up to 3000 using resonant phenomena. We propose and demonstrate t...Show More

Abstract:

This paper describes the characterization of high-permittivity materials with a dielectric constant (∈r) up to 3000 using resonant phenomena. We propose and demonstrate two types of measurement techniques: the rectangular resonator method by controlling the sample insertion length and the waveguide reflection method with a sample terminated by a short circuit. We investigate the validity and the range of application of both methods by performing numerical calculations. We also experimentally demonstrate these two methods by measuring dielectric materials with ∈r ~100 and 200 for the former method and those with ∈r ~200, 1400, 1700, and 2900 for the latter method. By estimating the measurement uncertainty using Monte Carlo calculations, we clarify that the results obtained by both methods for a dielectric material with ∈r ~ 200 are almost consistent within the ranges of the uncertainties.
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 66, Issue: 6, June 2017)
Page(s): 1191 - 1200
Date of Publication: 22 February 2017

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