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Iterative Subspace Analysis Based on Feature Line Distance | IEEE Journals & Magazine | IEEE Xplore

Iterative Subspace Analysis Based on Feature Line Distance


Abstract:

Nearest feature line-based subspace analysis is first proposed in this paper. Compared with conventional methods, the newly proposed one brings better generalization perf...Show More

Abstract:

Nearest feature line-based subspace analysis is first proposed in this paper. Compared with conventional methods, the newly proposed one brings better generalization performance and incremental analysis. The projection point and feature line distance are expressed as a function of a subspace, which is obtained by minimizing the mean square feature line distance. Moreover, by adopting stochastic approximation rule to minimize the objective function in a gradient manner, the new method can be performed in an incremental mode, which makes it working well upon future data. Experimental results on the FERET face database and the UCI satellite image database demonstrate the effectiveness.
Published in: IEEE Transactions on Image Processing ( Volume: 18, Issue: 4, April 2009)
Page(s): 903 - 907
Date of Publication: 10 March 2009

ISSN Information:

PubMed ID: 19278926

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References

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