Abstract:
This paper describes a new model for a set of test sequences where a set S is described by a single functional test sequence T. Using this model, a procedure that compact...Show MoreMetadata
Abstract:
This paper describes a new model for a set of test sequences where a set S is described by a single functional test sequence T. Using this model, a procedure that compacts T compacts all the sequences in S simultaneously. This enhances the ability of the procedure to compact the set compared with procedures that consider the sequences in the set individually. It also allows the test sequences in S to be redefined. If different sequences in S have substantially different lengths, repartitioning T allows new sequences with more uniform lengths to be obtained. After repartitioning, additional test compaction can be achieved. This paper describes a test compaction procedure that includes these operations based on the modeling of a set as a single sequence.
Published in: IEEE Transactions on Very Large Scale Integration (VLSI) Systems ( Volume: 23, Issue: 11, November 2015)