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Fast Analysis of Time Interval Error in Current-Mode Drivers | IEEE Journals & Magazine | IEEE Xplore

Fast Analysis of Time Interval Error in Current-Mode Drivers


Abstract:

An efficient approach for modeling of time interval error (TIE) due to noise in power delivery networks (PDNs), for current-mode (CM) driver circuits, is presented. Semia...Show More

Abstract:

An efficient approach for modeling of time interval error (TIE) due to noise in power delivery networks (PDNs), for current-mode (CM) driver circuits, is presented. Semianalytical expressions relating the PDN noise and TIE are developed based on midpoint delays of the rising and falling edges of the differential signal. The validating examples with CM driver circuits designed in various technologies comparing both the proposed and conventional approaches demonstrate a significant speedup using the proposed approach.
Page(s): 367 - 377
Date of Publication: 27 October 2017

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