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Detection of Recycled ICs Using Backscattering Side-Channel Analysis | IEEE Journals & Magazine | IEEE Xplore

Detection of Recycled ICs Using Backscattering Side-Channel Analysis


Abstract:

This article proposes a new, nondestructive method for detecting recycled integrated circuits (ICs) using the backscattering side-channel analysis (BSCA). In particular, ...Show More

Abstract:

This article proposes a new, nondestructive method for detecting recycled integrated circuits (ICs) using the backscattering side-channel analysis (BSCA). In particular, this article explains the impact that aging has on the backscattering side-channel signal and validates the findings through simulations. Then, a new detection algorithm based on singular value decomposition for distinguishing unaged and aged ICs from their backscattered measurements is presented. The proposed method is then validated in a series of experiments. The results show that the proposed method is effective in detecting recycled ICs after being aged for a small fraction of the IC’s lifetime (roughly 66 days). The experiments also demonstrate the impact that circuit size and complexity have on detection accuracy.
Page(s): 1244 - 1255
Date of Publication: 19 July 2022

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