The object of this research is to develop a fully automatic computation algorithm for quality control purposes during inspecting color filters. The hardware setup can analyze dyed pixels on the color filters upon acquiring the transmiting-through light waves ranging from 350 nm to 850 nm and a light wavelength resolution up to 3.49 nm, once a micro-spectrometer is employed. With the acquitted information this research builds a quality inspection algorithm to analyze the color properties of the dyed pixels, and performs dedicated statistics computations of the color filters automatically. With the analysis results of the typical color filter, its color quality can be justified using the developed quality computation algorithm, and any defects of the pixels on a sampled filter can also be detected. Hence, the automatic inspection system can evaluate the statistics of the acquired information and identify the grade of the inspected ones in order to assure the quality of each fabricated color filer. .