Abstract:
A random intrinsic chip ID method generates a pair of 4Kb binary strings using retention fails in 32nm SOI embedded DRAM. Hardware results show ID overlap distance mean=0...Show MoreMetadata
Abstract:
A random intrinsic chip ID method generates a pair of 4Kb binary strings using retention fails in 32nm SOI embedded DRAM. Hardware results show ID overlap distance mean=0.58 and σ=0.76 and demonstrate 100% authentication for 346 chips. The analytical model predicts >; 99.999% unique IDs for 106 parts.
Published in: 2012 Symposium on VLSI Circuits (VLSIC)
Date of Conference: 13-15 June 2012
Date Added to IEEE Xplore: 19 July 2012
ISBN Information:
Contents 