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A 290MV Ultra-Low Voltage One-Port SRAM Compiler Design Using a 12T Write Contention and Read Upset Free Bit-Cell in 7NM FinFET Technology | IEEE Conference Publication | IEEE Xplore

A 290MV Ultra-Low Voltage One-Port SRAM Compiler Design Using a 12T Write Contention and Read Upset Free Bit-Cell in 7NM FinFET Technology


Abstract:

In this work, we present an ultra-low voltage SRAM compiler targeting small to medium array sizes to provide a smaller area solution compared to conventional 6T -based SR...Show More

Abstract:

In this work, we present an ultra-low voltage SRAM compiler targeting small to medium array sizes to provide a smaller area solution compared to conventional 6T -based SRAMs. A 12T write contention and read upset free bit-cell is used in the design. Array architecture employs a read-modify-write scheme to support bit-write masking and column multiplexing. Built-in-self-test (BIST) and synchronous write-through (SWT) options are also supported to provide testability features while power management (PM) option is included to provide low-leakage sleep and shut-down modes. Proposed design is fabricated in 7nm FinFET technology and achieves lowest reported Vmin of 290mV in this technology.
Date of Conference: 18-22 June 2018
Date Added to IEEE Xplore: 25 October 2018
ISBN Information:
Print on Demand(PoD) ISSN: 2158-5601
Conference Location: Honolulu, HI, USA

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