Planar high performance ring generators | IEEE Conference Publication | IEEE Xplore

Planar high performance ring generators


Abstract:

The paper presents enhanced architectures of pseudo-random test pattern generators and on-chip test data decompressors based on ring generators. The new structures are ai...Show More

Abstract:

The paper presents enhanced architectures of pseudo-random test pattern generators and on-chip test data decompressors based on ring generators. The new structures are aimed at improving their layout and routing properties while at the same time reducing propagation delays introduced by associated phase shifters.
Date of Conference: 25-29 April 2004
Date Added to IEEE Xplore: 18 May 2004
Print ISBN:0-7695-2134-7
Print ISSN: 1093-0167
Conference Location: Napa Valley, CA, USA

References

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