Abstract:
Interdependence of the clocking architecture across IPs and overall peak power consumption is a major bottleneck that prevents concurrent yet independent testing of an IP...Show MoreMetadata
Abstract:
Interdependence of the clocking architecture across IPs and overall peak power consumption is a major bottleneck that prevents concurrent yet independent testing of an IP at a higher clock frequency. We use a dynamic clocking architecture that eliminates these dependencies and reduces peak shift power by using clock phase staggering at a granular level during system-on-chip (SoC) testing. A SoC design is typically composed of several Intellectual Property (IPs), some of which may be replicated. Generating a full set of test patterns targeting all IPs at the same time is computationally intensive and may be constrained by project schedule. Using this architecture, production test patterns are generated independently at the IP level and applied concurrently at the SoC level without exceeding the power budget of the chip during test. We present various aspects of the clocking architecture design along with simulation and silicon results to highlight the effectiveness of this architecture.
Published in: 2016 IEEE 34th VLSI Test Symposium (VTS)
Date of Conference: 25-27 April 2016
Date Added to IEEE Xplore: 26 May 2016
ISBN Information:
Electronic ISSN: 2375-1053